| Device
Characterization
In our industry, there is always a lot of attention given to meeting the
most challenging requirements for any test situation based upon the latest
devices and their design geometries. At 65 nm and below, it is possible
to meet the requirements for low level measurements using the most sensitive
characterization tools and procedures. Whether your lab has new parametric
analyzers or older traditional analyzers like the 4155 and 4156 instruments,
these instruments may still be adequate for some applications. For others,
Agilent's new B1500A’s or the Keithley 4200 systems offer a better
choice. SemiProbe encourages customers to purchase a prober designed to
meet your current needs. SemiProbe can supply you with a cost effective
system to meet most applications and offers upgrade paths to meet your
future requirements. |
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*
IV/DC parameters(fA,
aA)
* Capacitance(fF)
* 1/f
Noise |
*
HF parameters
* Environmental Stress
* Device
modeling |
SemiProbe
offers...
*
Coax
or triax manipulator arms to ensure signal integrity between your device
and the test instrumentation.
*
High
isolation chucks (coax and triax)
*
Environmental
chambers
*
Instrument/prober
drivers and custom test software
|
|
SemiProbe
can supply your probe system needs to meet your specific requirements
and match your test instrumentation! |
| SemiProbe device characterization
systems have drivers for many test instruments including Agilent instruments
like the B1500A, the
Keithley 4200, and VNA systems. We also have calibration software required
for HF testing. |
