IRIS Die & Wafer Inspection Systems

SemiProbe, a world leader in KGD test, offers macro defect inspection to provide microelectronic device manufacturers with quality assurance and process information. We offer manual, semiautomatic and fully automatic systems to inspect, locate and identify defects which may be created during wafer manufacturing, probing, bumping, dicing or general handling. IRIS inspection can Improve efficiency, Reduce
manufacturing costs, Increase yields and Shorten time to market!

Defect Inspection for:
w Probe mark
w Inking verification
w Residual films
w Thru Silicon Via
w Bump
w Saw
w Pattern
w Incomplete Etch
w Resist
w Scratches, cracks &
chips
w Large scale
contamination
w Passivation
Inspection on:
w MEMS
w Optical components
w Double sided devices
w Photovoltaics
w All Microelectronic
devices