SemiProbe has customized and application specific probing solutions for Singulated Die, Wafers, Substrates and Packaged Parts.
Manual - Semiautomatic - Fully Automatic probing systems for:
- • Integrated Circuits
- • Discrete Devices
- Diodes/Transistors
- SCRs, Thyristors, Triacs
- • Resistor Trimming
- • Substrates
- • Printed Circuit Boards
- • Flat Panel Displays
- • Multichip Modules
- • High Frequency/Microwave Devices
- Amplifiers
- MMICS
- T/R Modules
- • Optoelectronics
- LEDS
- VCSELS
- • MEMS
- Accelerometers
- Microbolometers
- Microfluidics
- • Device Characterization
- CV/IV
- • Failure Analysis
- Laser Microsurgery
- Emission Microscopy
- • Electrostatic Discharge (ESD)
- • Wafer Level Reliability
© 2007-08 SemiProbe. All Rights Reserved.

