SemiProbe has customized and application specific probing solutions for Singulated Die, Wafers, Substrates and Packaged Parts.

Manual - Semiautomatic - Fully Automatic probing systems for:

• Integrated Circuits
• Discrete Devices
Diodes/Transistors
SCRs, Thyristors, Triacs
• Resistor Trimming
• Substrates
• Printed Circuit Boards
• Flat Panel Displays
• Multichip Modules
• High Frequency/Microwave Devices
Amplifiers
MMICS
T/R Modules
• Optoelectronics
LEDS
VCSELS
• MEMS
Accelerometers
Microbolometers
Microfluidics
• Device Characterization
CV/IV
• Failure Analysis
Laser Microsurgery
Emission Microscopy
• Electrostatic Discharge (ESD)
• Wafer Level Reliability