Discrete device testing of small signal diodes to power transistors shares the same requirements as for testing optoelectronic devices. Small diameter and thin wafers with thousands of die place unique demands on probe systems. Most discrete products are sold at low prices so system speed, wafer stage specifications (accuracy, repeatability and resolution) and flexible software are important features to help lower the cost of test. The Probe System for Life ® (PS4L) semi and fully automatic systems provide a highly reliable, cost-effective platform to test the small wafers on which many of these devices are produced. Our industry leading KGD systems enable device producers to economically test their devices to KGD standards and achieve premium pricing. Our flexible software interfaces make the integration with discrete test equipment easy.