Optoelectronic Test Systems
SemiProbe has pioneered new methods and capabilities for testing optoelectronic components at wafer level and has extensive experience testing light emitting diodes (LED), vertical cavity surface emitting lasers (VCSEL) and photo diodes. Testing and handling small, fragile, thin wafers with thousands of die on them creates unique challenges that require innovative solutions. Our unique integrating sphere holder enables users to utilize the same Probe System for Life ® (PS4L) system for horizontal (EELD) and vertical (VCSEL, LED) testing in either a manual or semiautomatic configuration. We have created wafer maps capable of mapping >100k die, unique chuck systems to handle fragile or broken wafers, high speed stages and software to increase throughput. SemiProbe provides individual probe systems as well as integrated, turn-key testing and probing solutions.