Can Your Test Equipment Keep Up?
SemiProbe manufactures a comprehensive line of probing and inspection systems for semiconductor applications ranging from diagnostics and research to full production applications.
Advance and Apply Your Technology
SemiProbe designs an extensive line of application specific probing systems, including Device Characterization, High Frequency/Microwave, MEMS, Optoelectronics, and Failure Analysis and Photovoltaics.
Probe System For Life (PS4L)
One Platform, Easily Configurable, Many Applications
The Probe System for Life (PS4L) family of probing and inspection systems embodies SemiProbe’s patented adaptive architecture. Unlike traditional probe systems, all of the basic components of our systems are interchangeable, upgradable, and configurable.
High Power Devices
Optoelectronics and Photonics
A complete manipulator includes the manipulator, a faceplate, a probe arm and a base. SemiProbe manufactures a large selection of probe arms for a variety of applications.
Probe tips, also called probes or needle probes, are provided in a variety of materials, lengths, shapes and tip radius. They are typically inserted into a single probe arm mounted to a manipulator.