Failure Analysis (FA) plays a crucial role in the production of semiconductors. It provides process and design feedback to determine the root cause of any failures. Time-to-data for the FA Engineer is a critical measurement and SemiProbe’s Probe System for Life ® (PS4L) is ideally suited to excel in this application. All key components are interchangeable, making it easy to switch between individual die, wafers, and packaged parts.
SemiProbe has developed unique thermal stages, packaged part holders and manipulators to facilitate failure analysis testing. Our optics, CCTV systems and frame grabbers facilitate thorough and rapid documentation. Our family of manipulators, probe arms and bases allow the FA engineer to probe anything from bond pads to sub-micron features. When integrated with Emission and Thermal Microscope Systems, our probers provide stable, reliable support systems