Vacuum Probing Systems
Built using our PS4L patented technology, SemiProbe manufactures a family of Vacuum Probing Systems, which test wafers or substrates in a vacuum environment. Additionally, individual die and broken/partial wafers can be tested with the Vacuum Probing System. All key modules are interchangeable and upgradeable.
The Vacuum Probing system can be used from R&D to Production for die, partial wafers and whole wafers. It is ideal for MEMS, Sensors, Switches, Microbolometers or any product that is vacuum packaged.
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Double Sided Probing Systems
SemiProbe manufactures a family of manual and semiautomatic Double Sided Probing (DSP) systems. More and more applications are requiring the ability to probe from both sides of a die or wafer. Most DSP solutions involve one of the following scenarios:
- Simultaneously probe from both sides.
- Probe from the top, detect an output from the bottom.
- Probe from the bottom, detect an output from the top.
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Magnetic Stimulation Probing Systems
The Magnetic Stimulation System (MSS) controls the position of a stimulation magnetic source for semiconductor probing. The system manually controls the position of the Device Under Test (DUT), the contact probes, the microscope, and the magnetic source.
Applications:
- Memory – FRAM, FeRAM, MRAM
- MEMS
- Material Science