Probing Solutions Enhance Productivity

June 19, 2017

(microwaves & rf, 7/2015)

With its family of manual, semi-automatic, and fully automatic probing systems, SemiProbe also provides probing solutions to meet test requirements. The company’s Probe System for Life (PS4L) series of wafer probing systems is based on its patented adaptive architecture technology (Fig. 2). Unlike traditional systems, this technology allows all foundation modules, such as bases, stages, chucks, optics, manipulators, and more, to be interchangeable. As the environment or test conditions change, SemiProbe systems can be transformed on-site to meet these new demands, thus providing testing time and cost benefits.

The PS4L’s platen has a large surface, which accommodates multiple probe types, environmental chambers, and instrumentation. All SemiProbe semi-automatic and fully automatic systems operate on the PILOT control application suite, which is designed employing SemiProbe’s adaptive architecture. PILOT’s object-oriented software allows users to integrate the probe system quickly and easily with a broad array of test instrumentation. Drivers for most types of test instrumentation are readily available. In addition, new interfaces can easily be added.


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